SAP TE270 table - System Parameters for Sampling Proc./Cert. in IS-U DevMan. details in SAP
SAP TE270 table summary
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Dictionary Type: Transparent table
Description: System Parameters for Sampling Proc./Cert. in IS-U DevMan.
Field list for TE270 table on an S/4 SAP system
Details |
TE270-MANDT table field - Client ▼Description: Client |
TE270-VERLOS table field - Indicator: Loss of lot membership if removed/replaced ▼Description: Indicator: Loss of lot membership if removed/replaced |
TE270-VERBGL table field - Loss of certifiction if removed/replaced ▼Description: Loss of certifiction if removed/replaced |
TE270-BGLLOS table field - Device certification failure leads to loss of lot membership ▼Description: Device certification failure leads to loss of lot membership |
TE270-INTPRF table field - Internal cert. period is longer than calibration validity ▼Description: Internal cert. period is longer than calibration validity |
TE270-LOSLAGER table field - Uninstalled Devices Can Be Allocated to Lot ▼Description: Uninstalled Devices Can Be Allocated to Lot |
TE270-CHLOS table field - Manipulation of devices despite lot inspection/drawing ▼Description: Manipulation of devices despite lot inspection/drawing |
TE270-LAGINC table field - Warehouse devices allowed as sample devices ▼Description: Warehouse devices allowed as sample devices |
TE270-NLEG97 table field - Certification/seal extension control ▼Description: Certification/seal extension control |
TE270-NLBGLJ table field - Certification year same as installation year ▼Description: Certification year same as installation year |
TE270-CHSTI table field - Repeated use of devices for inspection ▼Description: Repeated use of devices for inspection |
TE270-CHBGL table field - Retain lot membership during certification ▼Description: Retain lot membership during certification |
TE270-CERTDEV table field - Certification period of device overrides lot ▼Description: Certification period of device overrides lot |
TE270-CERTLOTDEV table field - Only certified devices can be allocated to lots ▼Description: Only certified devices can be allocated to lots |
TE270-NO_SAMPLE_DEV table field - Exclude devices from sample drawing in I/R/R ▼Description: Exclude devices from sample drawing in I/R/R |
TE270-SEALDATECHECK table field - Check Last Seal Date Against Current Date ▼Description: Check Last Seal Date Against Current Date |
TE270-LOT_BREAKUP_PERI table field - No. of Years Within Which Lot Devices Must Be Replaced ▼Description: No. of Years Within Which Lot Devices Must Be Replaced |
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