Select data from sap tables TE27
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TE270 - System Parameters for Sampling Proc./Cert. in IS-U DevMan.
TE270EGERR - System Parameters for Dev. Info Records (IS-U Device Mgmnt)
TE270EZWG_DIM - Units of Measurement for Register Categories of Reg. Group
TE270WG - System Parameters for Winding Group
TE271 - Sample Lot
TE271E - Sample Lot - Canadian Sampling Inspection
TE271EMIG - Sample Lot - Canadian Sampling Inspection For Migration
TE271ES - Screen Fields for Canadian Sampling
TE271_1 - Fields Required for Alternate Sampling Algorithm
TE272 - Reasons for Reversal
TE272T - Reasons for Reversal (Texts)
TE272_F4 - Help Table for F4 Help for Reversal Reasons
TE275 - Search Term for Winding Grp
TE275T - Search Term for Winding Group (Txt)
TE276 - Nominal Voltage
TE276T - Nominal Voltage (Text)
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